Energy Dispersive (EDS/EDX) X-RAY Spectroscopy

The technique used in combination on scanning electron microscopy (SEM) through chemical microanalysis is Energy Dispersive X-Ray Spectroscopy (EDS or EDX). The X-ray emitted by this technique from the sample during the shelling of an electron beam to provide the elemental composition of analyzed volume.  The unique feature is that it can analyze up to 1 µm or less can be analyzed. The sample is shelled by the SEM’s electron beam, where electrons are ejected from these atoms comprising the sample’s surface. The result of the electron vacancies are filled by electrons from a higher state, and an x-ray is emitted to for the stability of energy difference between the electrons.

  • Silicon Drift detector
  • X-ray micro-tomography
  • Elemental mapping
  • Scanning electron microscopy
  • Transmission electron microscopy

Related Conference of Energy Dispersive (EDS/EDX) X-RAY Spectroscopy

April 17-18, 2024

14th International Conference on Chemistry Meeting

Paris, France
June 25-26, 2024

13th World Congress on Chromatography

Toronto, Canada
August 22-23, 2024

16th International Conference on Clinical Chemistry

Berlin, Germany
December 18-19, 2024

4th International Conference on Petrochemistry and Natural Gas

Amsterdam, Netherlands

Energy Dispersive (EDS/EDX) X-RAY Spectroscopy Conference Speakers

    Recommended Sessions

    Related Journals

    Are you interested in